KIC Awarded Key Patent for 24/7 Virtual Profiler Technology

(San Diego, CA -- January 4, 2005) : KIC, the leader of thermal process development and control software and winner of multiple VISION awards, announces that the company has been awarded a United States Patent on a technology that improves their KIC 24/7 Virtual Profiler. The inventors of this unique patent are Philip Kazmierowicz V.P. of R&D and Miles Moreau the manager of KIC‘s European sales.

The Patent for "Method for Correcting Process Temperature Profile in a Multi-Zone Thermal Processor" focuses on key technology that dramatically improves the accuracy of the KIC 24/7 Virtual Profiling feature. This feature allows the KIC 24/7 to display and record a "virtual" thermal profile for every product assembled.

Key statistics of these thermal profiles can be tracked on an SPC chart during production to provide real-time process monitoring. Thus, the KIC 24/7 can alarm when the process is out of statistical "control" but before the process is actually out of specification -- a significant benefit that results in both production and cost savings.

As companies strive to take cost out of production while maintaining or improving quality, it is important to reduce or eliminate error-prone manual tasks. The KIC 24/7 automatically provides the process data for each and every produced part without interfering with production. The process‘ "fit" to the established process window is also automatically calculated in real-time, and the KIC 24/7 will immediately alarm on any out of spec situation, as well as warn an impending an out of control process as calculated by its Cpk number.

KIC - Headquarter Office
15950 Bernardo Center Dr #E
San Diego, CA  92127

Company Contact:    Bjorn Dahle
                    +1(858)673-6050